International Journal of Reconfigurable and Embedded Systems (IJRES)
Vol 11, No 2: July 2022

Features measurement analysis of pull-in voltage for embedded MEMS

Hajar Baghdadi (Hassan 1st University)
Mohamed Lamhamdi (Hassan 1st University)
Karim Rhofir (Sultan Moulay Slimane University)



Article Info

Publish Date
01 Jul 2022

Abstract

The embedded micro electro mechanical systems (MEMS) is a technology that is creating a new era in all fields and especially in the internet of things (IoT) field. MEMS are necessary components for the realization of tiny micro/nano circuits. For this reason, designers are facing many challenges in designing embedded MEMS for achieving efficient products. The pull-in voltage is one of the most important parameters of MEMS design. In this work, we are interested in the analysis of some geometrical and mechanical parameters for the pull-in. The objective is to study of the concept of pull-in voltage in order to reduce it. First, we made a simulation to choose the appropriate material achieving a lower pull-in voltage. Then, we analysed the impact of geometrical parameters on the pull-in voltage. In this work, Finite element method using COMSOL Multiphysics® software is employed to compute the Pull-in voltage and study the behaviour of the MEMS Switch in order to optimize it. Pull-in voltage can be reduced by careful selection of the cantilever material and it can be further reduced by changing the beam parameters.

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Journal Info

Abbrev

IJRES

Publisher

Subject

Economics, Econometrics & Finance

Description

The centre of gravity of the computer industry is now moving from personal computing into embedded computing with the advent of VLSI system level integration and reconfigurable core in system-on-chip (SoC). Reconfigurable and Embedded systems are increasingly becoming a key technological component ...