IAES International Journal of Artificial Intelligence (IJ-AI)
Vol 14, No 5: October 2025

Automated vial defect inspection using Gabor wavelets and k-means clustering

C. R., Vishwanatha (Unknown)
Asha, V. (Unknown)
Channabasava, Channabasava (Unknown)
Rallapalli, Sreekanth (Unknown)



Article Info

Publish Date
01 Oct 2025

Abstract

This study proposes a machine vision-based defect inspection system for pharmaceutical vials, aiming to ensure the quality and safety of medicinal fluids. The system employs a series of image processing techniques, including denoising, feature extraction using the Gabor wavelet transform, segmentation, clustering with the K-means algorithm, and precise defect identification using the Canny edge operator. Experimental results demonstrate high performance, with recall, precision, accuracy, and F1-score exceeding 98%. Additionally, the proposed method achieves area under the curve-receiver-operating characteristic curve (AUC-ROC) and AUC-precision-recall (PR) values of approximately 98%. The system's average computational time is 355 microseconds, indicating its potential for real-time defect detection. Overall, this approach offers an effective solution for identifying various cosmetic defects such as scratches, bruises, cracks, and black spots, in pharmaceutical vials without the need for vial classification training. 

Copyrights © 2025






Journal Info

Abbrev

IJAI

Publisher

Subject

Computer Science & IT Engineering

Description

IAES International Journal of Artificial Intelligence (IJ-AI) publishes articles in the field of artificial intelligence (AI). The scope covers all artificial intelligence area and its application in the following topics: neural networks; fuzzy logic; simulated biological evolution algorithms (like ...