Article Per Year (5 Year)
p-Index From 2021 - 2026
0.444
P-Index
This Author published in this journals
All Journal International Journal of Electrical and Computer Engineering IAES International Journal of Artificial Intelligence (IJ-AI)
Asha, V.
Unknown Affiliation
Computer Science & IT Electrical & Electronics Engineering Engineering

Published : 2 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 2 Documents
Search

 1 
Phase structures-based hybrid approaches for defect detection in vials Vishwanatha, C. R.; Asha, V.
International Journal of Electrical and Computer Engineering (IJECE) Vol 14, No 5: October 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v14i5.pp5185-5199

Abstract

Quality control and assurance in pharmaceutical vial manufacturing are paramount to ensure drug safety and efficacy. Defects such as cracks, bubbles, black spots, and wrinkles can compromise product quality and patient safety. This study proposes a novel methodology that integrates fast non-local means (FNLM) filtering with hybrid image processing techniques to detect these defects. Previous approaches have often struggled with subtle anomalies in texture and surface features. The proposed solution leverages phase structure analysis, utilizing phase stretch transform (PST) to effectively highlight subtle anomalies by extracting features sensitive to phase variations. These features are further refined using Gaussian filtering, with Otsu thresholding applied for precise segmentation and defect boundary identification. Morphological dilation enhances detection speed and accuracy, while region of interest (ROI) identification aids in localizing defects and facilitating decision-making. The system demonstrates significant improvements in quality control, achieving high performance metrics: precision (98.85%), recall (98.57%), accuracy (98.36%), specificity (98.0%), and F1-score (98.71%). It also achieves impressive AUC-ROC (98.18%) and AUC-PR (99.08%) values, demonstrating its robustness and suitability for defect detection in pharmaceutical vials.
Automated vial defect inspection using Gabor wavelets and k-means clustering C. R., Vishwanatha; Asha, V.; Channabasava, Channabasava; Rallapalli, Sreekanth
IAES International Journal of Artificial Intelligence (IJ-AI) Vol 14, No 5: October 2025
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijai.v14.i5.pp4279-4289

Abstract

This study proposes a machine vision-based defect inspection system for pharmaceutical vials, aiming to ensure the quality and safety of medicinal fluids. The system employs a series of image processing techniques, including denoising, feature extraction using the Gabor wavelet transform, segmentation, clustering with the K-means algorithm, and precise defect identification using the Canny edge operator. Experimental results demonstrate high performance, with recall, precision, accuracy, and F1-score exceeding 98%. Additionally, the proposed method achieves area under the curve-receiver-operating characteristic curve (AUC-ROC) and AUC-precision-recall (PR) values of approximately 98%. The system's average computational time is 355 microseconds, indicating its potential for real-time defect detection. Overall, this approach offers an effective solution for identifying various cosmetic defects such as scratches, bruises, cracks, and black spots, in pharmaceutical vials without the need for vial classification training. 
Co-Authors C. R., Vishwanatha Channabasava, Channabasava Rallapalli, Sreekanth Vishwanatha, C. R.