<![CDATA[This study aims to determine the validity and reliability of the short version of the Level of Expressed Emotion (LEE) Scale in measuring family emotional expression toward individuals with schizophrenia. A quantitative approach with a descriptive correlational design was employed. A total of 18 respondents were purposively selected from families living with schizophrenia patients. The instrument consisted of two subscales: Critical Comments and Emotional Overinvolvement. Validity testing revealed that all items in both subscales had correlation coefficients greater than the critical value (r > 0.443) and were statistically significant at p < 0.05. Reliability testing yielded Cronbach's Alpha values of 0.934 for Critical Comments and 0.866 for Emotional Overinvolvement, indicating high internal consistency. Therefore, the short version of the LEE Scale is a valid and reliable tool to assess family emotional expression that may influence relapse in individuals with schizophrenia.]]>
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