Building of Informatics, Technology and Science
Vol 8 No 1 (2026): June 2026

Klasifikasi Risiko Bencana di Indonesia Menggunakan SVM dan Random Forest

Erland Adhe Sharendra (Universitas Teknokrat Indonesia, Bandar Lampung)
Tri Widodo (Universitas Teknokrat Indonesia, Bandar Lampung)
Damayanti Damayanti (Universitas Teknokrat Indonesia, Bandar Lampung)
Okma Arnilia (Universitas Islam Negeri Siber Syekh Nurjati, Cirebon)



Article Info

Publish Date
05 Jun 2026

Abstract

Indonesia is a country with a high level of disaster vulnerability, requiring effective methods to accurately classify disaster risk levels. This study aims to analyze and compare the performance of Support Vector Machine (SVM) and Random Forest algorithms in disaster risk classification. The dataset used consists of disaster event data from 2019–2024, including disaster type, region, number of victims, and population density. Disaster risk levels were classified into three categories, namely low, medium, and high, based on the total impact calculated from the number of victims. The proposed method includes data preprocessing, normalization, and train-test data splitting. The results show that both models achieved high performance, where Random Forest obtained an accuracy of 95.66% and SVM achieved 95.28%, with ROC-AUC values of 0.9823 and 0.9769, respectively. Random Forest demonstrated slightly better performance with an accuracy difference of 0.38% and more consistent prediction results. The high performance indicates that the models were able to recognize the main patterns within the dataset, although the results were also influenced by the characteristics of the data used. Overall, Random Forest is more suitable for disaster risk classification on data with complex characteristics.

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Journal Info

Abbrev

bits

Publisher

Subject

Computer Science & IT

Description

Building of Informatics, Technology and Science (BITS) is an open access media in publishing scientific articles that contain the results of research in information technology and computers. Paper that enters this journal will be checked for plagiarism and peer-rewiew first to maintain its quality. ...