JFA (Jurnal Fisika dan Aplikasinya)
Vol 19 No 2 (2023): June 2023 Edition

Determining the Deposition Rate of Semiconducting Intrinsic Layer Prepared by Nanospray Method: Aulia Anisa Firdaus, Endhah Purwandari, Retno Asih, Ahmad Sholih, Darminto Darminto

Aulia Anisa Firdaus Aulia Anisa Firdaus (Department of Physics, Institut Teknologi Sepuluh Nopember, Kampus ITS-Sukolilo Surabaya)
Endhah Purwandari Endhah Purwandari (Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Jember, Jember 68121)
Retno Asih Retno Asih (Department of Physics, Institut Teknologi Sepuluh Nopember, Kampus ITS-Sukolilo Surabaya)
Ahmad Sholih Ahmad Sholih (Department of Physics, Institut Teknologi Sepuluh Nopember, Kampus ITS-Sukolilo Surabaya)
Darminto Darminto (Department of Physics, Institut Teknologi Sepuluh Nopember, Kampus ITS-Sukolilo Surabaya)



Article Info

Publish Date
08 May 2025

Abstract

Amorphous carbon (a-C) film provides potential ability as an i-type layer in semiconductor material for photovoltaic purposes due to its tunable properties. Here, we investigate how to get the deposition rate estimation of the thickness and homogenous surface of a-C film as an i-type in solar cell applications. The a-C was prepared from palmyra liquid sugar using nebulizer as a nanospray method. The thick palmyra liquid sugar was carbonized at 250 C for 2.5 hours then continued at 300 C for 2 hours to obtain high-carbon charcoal. The thickness was examined using a SEM cross section, and the amorphous phase was measured using XRD. The amorphous characteristic of a-C is confirmed by broad peaks in XRD patterns. The thickness of a-C films was found to be thinner than in a previous study that used a similar materials and methods but different equipment in the deposition process. The average thickness of a-C films is in the range of 200 to 450 nm, followed by an increase in the deposition time of 5 to 25 s. By these value, the deposition rate estimation was obtained using extrapolation linier method from the SEM result around 11.62 nm/s. This result can be used as a reference to make various thicknesses for the i-layer in order to find the maximum thickness that gives high efficiency to amorphous carbon film.

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Journal Info

Abbrev

jfa

Publisher

Subject

Physics

Description

JFA (Jurnal Fisika dan Aplikasinya, Abbreviation: J.Fis. dan Apl.) hanya menerbitkan artikel penelitian asli serta mengulas artikel tentang topik seputar bidang fisika (fisika teori, material, optik, instrumentasi, geofisika) dan aplikasinya. Naskah yang dikirimkan ke JFA belum pernah diterbitkan ...