Indonesian Journal of Chemistry
Vol 5, No 3 (2005)

CHARACTERIZATION OF SURFACE OF THE (010) FACE OF BORAX CRYSTALS USING EX SITU ATOMIC FORCE MICROSCOPY (AFM):

Suharso Suharso (Department of Chemistry, Faculty of Mathematics and Natural Sciences, University of Lampung Jl. Sumantri Brojonegoro 1, Gedung Meneng-Bandarlampung)

Article Info

Publish Date
15 Jun 2010

Abstract

The surface topology of borax crystals grown at a relative supersaturation of 0.21 has been investigated using ex situ atomic force microscopy (AFM). It was found that the cleavage of borax crystals along the (010) face planes has features of the cleavage of layered compounds, exhibiting cleavage steps of low heights. The step heights of the cleavage of the (010) face of borax crystal are from one unit cell to three unit cells of this face.

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Journal Info
Indonesian Journal of Chemistry
Website

Abbrev

ijc

Publisher

Universitas Gadjah Mada

Subject

Chemical Engineering, Chemistry & Bioengineering Chemistry

Description

Indonesian Journal of Chemistry is an International, peer-reviewed, open access journal that publishes original research articles, review articles, as well as short communication in all areas of chemistry including applied chemistry. The journal is accredited by The Ministry of Research, Technology ...