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INDONESIA
Indonesian Journal of Physics (IJP)
Published by Institut Teknologi Bandung
ISSN : 23018151     EISSN : 29870828     DOI : https://doi.org/10.5614/itb.ijp
Core Subject : Science, Engineering,
Astronomy Computer Science & IT Earth & Planetary Sciences Electrical & Electronics Engineering Energy Engineering
Indonesian Journal of Physics welcomes full research articles in the area of Sciences and Engineering from the following subject areas: Physics, Mathematics, Astronomy, Mechanical Engineering, Civil and Structural Engineering, Chemical Engineering, Electrical Engineering, Geotechnical Engineering, Engineering Science, Environmental Science, Materials Science, and Earth-Surface Processes. Authors are invited to submit articles that have not been published previously and are not under consideration elsewhere.
Arjuna Subject : Fisika dan Astronomi - Fisika Nuklir dan Molekuler, dan Ooptik
Articles 6 Documents
 1 
Search results for , issue "Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001" : 6 Documents clear
Identitas Nielsen Triyanta Triyanta; Sutisna Sutisna
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

The gauge dependence of the effective action Γ that has been known for quite a long time is shown by a differential equation called the Nielsen identity. The identities appear in quantum field theory as due to the invariance of the Lagrange density with respect to the extended BRST transformations. In this paper the identities, both for the case of QED and QCD, will be derived in some gauge choices, first by following a method found in the references and second by a proposed method.
Efek Annealing Pada Penumbuhan Film Tipis Ferroelektrik PbZr0,625Ti0,375O3 (PZT) Ngurah Ayu Ketut Umiati; Irzaman Irzaman; Maman Budiman; M. Barmawi
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

Ferroelectric materials have many advantages including microactuator (piezoelectric properties), Dynamic Random Access Memory, DRAM (permitivity and polarisability) and infrared sensor (pyroelectric properties). PbZr1-xTixO3 (PZT) is ferroelectric materials, that can be piezoelectric and pyroelectric materials. In this experiment, annealing effect on growing process of thin films PbZr1-xTixO3 (PZT) using dc unbalanced magnetron sputtering is studies. PZT thin films were deposited at temperature 550oC – 650oC on Si (100) substrate with annealing condition and without annealing condition. Ratio of gas flow Ar/O2 was 50 sccm : 10 sccm, basic pressure was 0.051 Torr, and deposition pressure was 1.3 Torr. Annealing temperature was 650oC at pressure 0.58 Torr. The XRD results showed that annealing process caused crystal orientation of thin films more oddered. Some orientations that appear in the results without annealing process disappear after annealing process. This can also be seen in the morphological form of grain size PZT obtained from SEM characterization.
Studi Struktur Kristal Film Tipis Galliumantimony yang Ditumbuhkan dengan MOCVD Reaktor Vertikal Zulirfan Zulirfan; Euis Sustini; Maman Budiman
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

GaSb thin films have been grown by using vertical reactor MOCVD on (100) SI-GaAs substrates. TMGa and TDMASb were used as a precursor of group III and V respectively, with H2 as gas carrier. Films were grown at the growth temperatures 5200C and 540 oC as a function of V/III ratio. The range of V/III ratio were 0,4 - 3,1. The ex-situ characterization, XRD and SEM were used to examine the crystal structure and the morphology of the films, respectively. EDS characterization were used to find the composition of Ga and Sb atoms in the films. The increased of V/III ratio were found to have a significant effect on the both properties. Film grown at the lowest V/III ratio (0,4) shows a polycrystal structure with several peaks of GaSb crystal’s orientation, and bad surface morphology. Films grown at V/III ratio ranged about 1.0 to 3.1 show the same crystal’s orientation of GaSb, of (200) and (400). The better surface morphology were found at the growth temperature 540 oC with V/III ratio 2,0.
EPR Analysis on Radiation Dosimetry Material Spectra AuthorFrida U. Ermawati
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

Radiation dosimetry work on L-α-alanine based on EPR analysis is carried out to identify radicals induced by irradiation in the system. A Varian E-12 EPR spectrometer with a rectangular parallelepiped microwave cavity to produce TE102 mode was utilized to measure first derivative absorption lines of X-band CW spectra of γ-irradiated L-α-alanine single crystals at room temperature. Six different resonance spectra measured from a number of defined crystal orientations to the magnetic field were obtained. The dominating feature of the spectrum along the <c> is a quintet with the intensity ratio close to 1:4:6:4:1. Along the <a> and <b>, the quintet is split into a quartet of line pairs with the intensity ratio 1:1:3:3:3:3:1:1 , accompanied by weaker resonance features. When the magnetic field is fixed on crystal planes, however, the spectrum is of superposition of two different spectra. Crystallographic and computed spectral simulation studies on the system clarified these analyses.
Inversi Kuadrat Terkecil Dari Turunan Horizontal Pertama (THP) Anomali Gaya Berat Residual Rata-Rata Berjalan Untuk Menafsirkan Parameter-Parameter Sesar di Segmen Kerinci Ahmad Fauzi Fauzi; Badrul M. Kemal; W.G.A. Kadir
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

A quantitative interpretation using a least-squares inverse based on the analytical expression from the first horizontal derivative (FHD) of moving average residual gravity anomalies is used to find depth and thickness of the fault. The problem of the depth determination has been transformed into the problem of finding a solution of a non-linear equation of the form f (z)=0. As a case study, this inverse is applied to carry out the fault parameters in the Kerinci segment. Two lines of gravity survey were carried out along and cross the Sumatra Fault System (SFS). The gravity anomaly pattern reflected a fault structure at northwest Sungaipenuh area in line along SFS and two-fault structure at western and eastern Sungaipenuh area in line cross SFS. The central depth and thickness of fault as a result inverse are 2.533 km and 0.815 km; 1.113 km and 1.985 km; 2.318 km and 4.195 km, respectively, for faults at northwestern, western and eastern Sungaipenuh area. The density contras is assumed - 0,43 g/cm3. Surface layer, basement and the layer faulted are reconstructed with density 2.22 g/cm3, 2.75 g/cm3 and 2.32 g/cm3, respectively. These results inverse agree with 2.5D forward model.
Karakteristik Ketebalan Optik Aerosol di Bandung Tuti Budiwati; Sumaryati Sumaryati; Iis Sofiati
Indonesian Journal of Physics Vol 12 No 4 (2001): Vol. 12 No.4, Oktober 2001
Publisher : Institut Teknologi Bandung

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Abstract

We’ve been measured the radiation intensity on the clear by sun photometer model MS-120 with wavelength of λ=368, 500, 675, and 778 nm from 1996 to 1998 in LAPAN-Bandung. The data of intensity of radiation were calculated to become the data of optical depth and atmospheric turbidity. From the calculated results apparently the aerosol optical depth was influenced by the source of pollutant particle and relative humidity. The optical depths of aerosol on the wavelength region 500 nm in 1996, 1997 and 1998 have values 1.080; 0.923 and 0.913 respectively. The magnitude of optical depth of aerosol influence to atmospheric turbidity. The coefficient of atmospheric turbidity on wavelength 500 nm in Bandung has range from 0.25-1.20 during dry season (from June to October) from 1996-1998.

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