Yasir Hashim
Tishk International University (TIU)

Published : 2 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search
Journal : TELKOMNIKA (Telecommunication Computing Electronics and Control)

A new factor for fabrication technologies evaluation for silicon nanowire transistors Yasir Hashim; Mohammed Nazmus Shakib
TELKOMNIKA (Telecommunication Computing Electronics and Control) Vol 18, No 5: October 2020
Publisher : Universitas Ahmad Dahlan

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12928/telkomnika.v18i5.12121

Abstract

This paper reviews the fabrication technologies of silicon nanowire transistors (SiNWTs) and rapidly development in this area, as this paper presents various types of SiNWT structures, development of SiNWT properties and different applications until nowadays.  This research provides a good comparison among fabrication technologies of SiNWTs depending on a new factor DIF, this factor depends on the size of channel and power consumption in channel. As a result of this comparison, the best technology to use in the future to fabricate silicon nano transistors for future ICs is AFM nanolithography.