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This Author published in this journals
All Journal International Journal of Electrical and Computer Engineering TELKOMNIKA (Telecommunication Computing Electronics and Control)
Yasir Hashim
Tishk International University
Computer Science & IT Electrical & Electronics Engineering

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Journal : International Journal of Electrical and Computer Engineering

 1 
The impact of channel fin width on electrical characteristics of Si-FinFET Yousif Atalla; Yasir Hashim; Abdul Nasir Abd. Ghafar
International Journal of Electrical and Computer Engineering (IJECE) Vol 12, No 1: February 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v12i1.pp201-207

Abstract

This paper studies the impact of fin width of channel on temperature and electrical characteristics of fin field-effect transistor (FinFET). The simulation tool multi-gate field effect transistor (MuGFET) has been used to examine the FinFET characteristics. Transfer characteristics with various temperatures and channel fin width (WF=5, 10, 20, 40, and 80 nm) are at first simulated in this study. The results show that the increasing of environmental temperature tends to increase threshold voltage, while the subthreshold swing (SS) and drain-induced barrier lowering (DIBL) rise with rising working temperature. Also, the threshold voltage decreases with increasing channel fin width of transistor, while the SS and DIBL increase with increasing channel fin width of transistor, at minimum channel fin width, the SS is very near to the best and ideal then its value grows and going far from the ideal value with increasing channel fin width. So, according to these conditions, the minimum value as possible of fin width is the preferable one for FinFET with better electrical characteristics.
Design and implementation of Arduino based robotic arm Hussein Mohammed Ali; Yasir Hashim; Ghadah Alaadden Al-Sakkal
International Journal of Electrical and Computer Engineering (IJECE) Vol 12, No 2: April 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v12i2.pp1411-1418

Abstract

This study presents the model, design, and construction of the Arduino based robotic arm, which functions across a distance as it is controlled through a mobile application. A six degree of freedom robotic arm has been designed and implemented for the purpose of this research. The design controlled by the Arduino platform receives orders from the user’s mobile application through wireless controlling signals, that is Bluetooth. The arm is made up of five rotary joints and an end effector, where rotary motion is provided by the servomotor. Each link has been first designed using solid works and then printed by 3D printer. The assembly of the parts of the robot and the motor’s mechanical shapes produce the final prototype of the arm. The Arduino has been programmed to provide rotation to each corresponding servo motor to the sliders in the designed mobile application for usage from distance.
Arduino based 74-series integrated circuits testing system at gate level Yasir Hashim; Marwa Awni; Abdullah Mufeed
International Journal of Electrical and Computer Engineering (IJECE) Vol 13, No 5: October 2023
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v13i5.pp4950-4957

Abstract

The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.
Co-Authors Abdul Nasir Abd. Ghafar Abdullah Mufeed Alaa Ghazi Abdulbaqi Firas Natheer Abdul-Kadir Ghadah A. Al-Sakkal Ghadah Alaadden Al-Sakkal Hussein Mohammed Ali Khalid khaleel Mohammad Marwa Awni Mohammed Nazmus Shakib Yousif Atalla