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All Journal International Journal of Electrical and Computer Engineering
D. R. V. A. Sharath Kumar
KLEF, Mallareddy Institute of Technology
Computer Science & IT Electrical & Electronics Engineering

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A test architecture design for SoCs using ATAM method D. R. V. A. Sharath Kumar; Ch. Srinivas Kumar; Ragamayi S.; P. Sampath Kumar; K. Saikumar; Sk. Hasane Ahammad
International Journal of Electrical and Computer Engineering (IJECE) Vol 10, No 1: February 2020
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (654.583 KB) | DOI: 10.11591/ijece.v10i1.pp719-727

Abstract

Test arranging is a basic issue in structure on-a-chip (S.O.C) experiment mechanization. Capable investigation designs constrain the general organization check request time, keep away from analysis reserve conflicts, in addition to purpose of restriction control disseminating in the midst of examination manner. In this broadsheet, we absent a fused method to manage a couple of test arranging issues. We first present a system to choose perfect timetables for sensibly evaluated SOC’s among need associations, i.e., plans that spare alluring orderings among tests. This furthermore acquaints a capable heuristic estimation with plan examinations designed for enormous S.O.Cs through need necessities in polynomial occasion. We portray a narrative figuring with the purpose of uses pre-emption of tests to secure capable date-books in favour of SOCs. Exploratory marks on behalf of an educational S-O-C plus a cutting edge SOC exhibit with the aim of capable investigation timetables be able to subsist gained in sensible CPU occasion.
Co-Authors Ch. Srinivas Kumar K. Saikumar P. Sampath Kumar Ragamayi S. Sk. Hasane Ahammad