Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (685.255 KB) | DOI: 10.31284/j.iptek.2016.v20i2.42
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.28989/senatik.v5i0.365
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j26139960.v8i4.1057
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.28989/senatik.v5i0.365
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54518/rh.5.2.2025.473
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (151.235 KB) | DOI: 10.12962/j24068535.v1i1.a95
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (163.807 KB) | DOI: 10.12962/j24068535.v1i1.a96
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (325.616 KB) | DOI: 10.12962/j24068535.v5i1.a200