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Navneet Gupta
Birla Institute of Technology and Science Pilani
Computer Science & IT Electrical & Electronics Engineering Engineering

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Zinc Oxide Thin Film Transistors: Advances, Challenges and Future Trends Kavindra Kandpal; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (664.657 KB) | DOI: 10.11591/eei.v5i2.530

Abstract

This paper presents a review on recent developments and future trends in zinc oxide thin film transistors (ZnO TFTs) together with challenges involved in this technology. It highlights ZnO TFT as next generation choice over other available thin film transistor technology namely a – Si: H (amorphous hydrogenated silicon), poly-Si (polycrystalline silicon) and OTFT (organic thin film transistor). This paper also provides a comparative analysis of various TFTs on the basis of performance parameters.  Effect of high –k dielectrics, grain boundaries, trap densities, and threshold voltage shift on the performance of ZnO TFT is also explained.
Selection of Gate Dielectrics for ZnO Based Thin-Film Transistors Vaibhav Garg; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (385.821 KB) | DOI: 10.11591/eei.v5i2.531

Abstract

The bulk of semiconductor technology has been based on silicon till today. But silicon has its own limitations. It is not transparent to visible light and hence it cannot be used in certain applications. ZnO is a material which is transparent to visible light. In this paper, we compare the electrical performance of ZnO Thin film Transistors using different gate insulators. Certain performance indices and material indices were considered as the selection criteria for electrical performance. A methodology known as Ashby’s approach was adopted to find out the best gate insulators and based on this methodology various charts were plotted to compare different properties of competing materials. This work concludes that Y2O3 is the best insulator followed by ZrO2 and HfO2.
Zinc Oxide Thin Film Transistors: Advances, Challenges and Future Trends Kavindra Kandpal; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (664.657 KB) | DOI: 10.11591/eei.v5i2.530

Abstract

This paper presents a review on recent developments and future trends in zinc oxide thin film transistors (ZnO TFTs) together with challenges involved in this technology. It highlights ZnO TFT as next generation choice over other available thin film transistor technology namely a – Si: H (amorphous hydrogenated silicon), poly-Si (polycrystalline silicon) and OTFT (organic thin film transistor). This paper also provides a comparative analysis of various TFTs on the basis of performance parameters.  Effect of high –k dielectrics, grain boundaries, trap densities, and threshold voltage shift on the performance of ZnO TFT is also explained.
Selection of Gate Dielectrics for ZnO Based Thin-Film Transistors Vaibhav Garg; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (385.821 KB) | DOI: 10.11591/eei.v5i2.531

Abstract

The bulk of semiconductor technology has been based on silicon till today. But silicon has its own limitations. It is not transparent to visible light and hence it cannot be used in certain applications. ZnO is a material which is transparent to visible light. In this paper, we compare the electrical performance of ZnO Thin film Transistors using different gate insulators. Certain performance indices and material indices were considered as the selection criteria for electrical performance. A methodology known as Ashby’s approach was adopted to find out the best gate insulators and based on this methodology various charts were plotted to compare different properties of competing materials. This work concludes that Y2O3 is the best insulator followed by ZrO2 and HfO2.
Zinc Oxide Thin Film Transistors: Advances, Challenges and Future Trends Kavindra Kandpal; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (664.657 KB) | DOI: 10.11591/eei.v5i2.530

Abstract

This paper presents a review on recent developments and future trends in zinc oxide thin film transistors (ZnO TFTs) together with challenges involved in this technology. It highlights ZnO TFT as next generation choice over other available thin film transistor technology namely a – Si: H (amorphous hydrogenated silicon), poly-Si (polycrystalline silicon) and OTFT (organic thin film transistor). This paper also provides a comparative analysis of various TFTs on the basis of performance parameters.  Effect of high –k dielectrics, grain boundaries, trap densities, and threshold voltage shift on the performance of ZnO TFT is also explained.
Selection of Gate Dielectrics for ZnO Based Thin-Film Transistors Vaibhav Garg; Navneet Gupta
Bulletin of Electrical Engineering and Informatics Vol 5, No 2: June 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (385.821 KB) | DOI: 10.11591/eei.v5i2.531

Abstract

The bulk of semiconductor technology has been based on silicon till today. But silicon has its own limitations. It is not transparent to visible light and hence it cannot be used in certain applications. ZnO is a material which is transparent to visible light. In this paper, we compare the electrical performance of ZnO Thin film Transistors using different gate insulators. Certain performance indices and material indices were considered as the selection criteria for electrical performance. A methodology known as Ashby’s approach was adopted to find out the best gate insulators and based on this methodology various charts were plotted to compare different properties of competing materials. This work concludes that Y2O3 is the best insulator followed by ZrO2 and HfO2.
Co-Authors Kavindra Kandpal Vaibhav Garg