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All Journal Bulletin of Electrical Engineering and Informatics
Kalluri, Venkata Saiteja
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Electrical & Electronics Engineering

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Enhancing manufacturing efficiency: leveraging CRM data with Lean-based DL approach for early failure detection Kalluri, Venkata Saiteja; Malineni, Sai Chakravarthy; Seenivasan, Manjula; Sakkarai, Jeevitha; Kumar, Deepak; Ananthan, Bhuvanesh
Bulletin of Electrical Engineering and Informatics Vol 14, No 3: June 2025
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v14i3.8757

Abstract

In the pursuit of enhancing manufacturing competitiveness in India, companies are exploring innovative strategies to streamline operations and ensure product quality. Embracing Lean principles has become a focal point for many, aiming to optimize profitability while minimizing waste. As part of this endeavour, researchers have introduced various methodologies grounded in Lean principles to track and mitigate operational inefficiencies. This paper introduces a novel approach leveraging deep learning (DL) techniques to detect early failures in manufacturing systems. Initially, realtime data is collected and subjected to a normalization process, employing the weighted adaptive min-max normalization (WAdapt-MMN) technique to enhance data relevance and facilitate the training process. Subsequently, the paper proposes the utilization of a triple streamed attentive recalling recurrent neural network (TSAtt-RRNN) model to effectively identify Leanbased manufacturing failures. Through empirical evaluation, the proposed approach achieves promising results, with an accuracy of 99.23%, precision of 98.79%, recall of 98.92%, and F-measure of 99.2% in detecting early failures. This research underscores the potential of integrating DL methodologies with customer relationship management (CRM) data to bolster early failure detection capabilities in manufacturing, thereby fostering operational efficiency and competitive advantage.
Co-Authors Ananthan, Bhuvanesh Deepak Kumar Malineni, Sai Chakravarthy Sakkarai, Jeevitha Seenivasan, Manjula