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Implementation of MQTT Protocol on ESP32-Based OEE Analysis Development Board Amir Akbar Wicaksono; Yuli Kurnia Ningsih; Indra Surjati
Emitor: Jurnal Teknik Elektro Vol 24, No 2: July 2024
Publisher : Universitas Muhammadiyah Surakarta

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.23917/emitor.v24i2.3908

Abstract

The transition to Industry 4.0 requires major investments in devices and mechanisms that enable interconnectivity between people, machines, and processes. One important concept related to Industry 4.0 is the so-called Industrial Internet Of Things or IIoT. The application of IIoT in the industrial scope is the measurement of Overall Equipment Effectivness (OEE) through the IoT paradigma. Generally, OEE measurements are carried out manually by production operators on the machine being measured, and data processing is carried out by supervision manually as well to then analyze the OEE value of the machine being measured. In this research, an ESP32-based OEE Analysis Development Board with MQTT protocol is proposed to replace the manual OEE measurement process. The results of direct implementation on the production floor show that the ESP32-based OEE Analysis Development Board with MQTT protocol can be used as an alternative to OEE measurement with a maximum error value on OEE measurement of 16%.
The Effect of Voltage Quality Variations on The Performance and Operational Lifespan of Electronic Equipment in the Electrical System of Educational Buildings Salsanabila Mariestiara Putri; Asro; Tb. Ade Rahmatullah; Mujiburohman; Amir Akbar Wicaksono
HORIZON: Indonesian Journal of Multidisciplinary Vol. 4 No. 3 (2026): HORIZON: Indonesian Journal of Multidisciplinary (In-Press)
Publisher : Lembaga Intelektual Muda (LIM) Maluku

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/hijm.v4i3.5504

Abstract

This study aims to analyze the effect of voltage quality variations on the performance and estimated operational lifespan of electronic equipment. The study uses a quantitative explanatory approach with a field measurement design (in-situ) through the use of a power quality analyzer and supporting instruments. Data were analyzed using descriptive statistics, correlation analysis, and multiple linear regression. The results show that voltage quality variations occur unevenly, with the highest level of disturbances in areas with high electronic load density. Total harmonic distortion (THDv), voltage sag, and voltage unbalance are the most dominant factors influencing performance degradation and accelerating equipment operational degradation. The regression model shows a significant effect with strong explanatory power. This study confirms that voltage quality variations directly impact short-term performance and contribute to equipment operational lifespan reduction through the accumulation of electrical and thermal stress, making power quality management a crucial aspect in improving system reliability and efficiency of educational building facility management