Abstract: Magnetoimpedance (MI) effect was observed on multilayer samples [Ni80Fe20(800)nm)/Cu(x)nm]4 Cu-Printed Circuit Board substrates. The multilayer system was grown through an electrodeposition process by modifying thickness of the Cu layer. The MI effect was analyzed by means of an impedance test under an external magnetic field at low frequency 100 kHz. The results found that MI ratio increased ± 1.02 fold with the reduction Cu layer (800 nm until 0 nm) from 2.39% to 3.44%. This condition is believed by differences resistance of magnetic layer to conductive layer in the multilayers system. The measured sample resistance value is inversely proportional to the function of “x” as the thickness of the conductive layer. This means that the reduction conductive layer can be improve magnetic properties for a multilayer [Nife/Cu]N system. The analysis calculation of the sensitivity value also shows the potential increase sample sensitivity to 0.9746% / mT.Abstrak: Magnetoimpedansi (MI) telah diamati untuk sampel multilapisan [Ni80Fe20(800)nm)/Cu(x)nm]4 substrat Cu-Printed Circuit Board. Sistem multilapisan ditumbuhkan melalui proses elektrodeposisi dengan memodifikasi ketebalan lapisan Cu. Efek MI dianalisis melalui pengujian impedansi dibawah medan magnet luar pada frekuensi 100 kHz. Hasil uji ditemukan rasio MI meningkat ±1.02 kali lipat dengan berkurangnya lapisan Cu (800 nm sampai 0 nm) dari 2,39 % menjadi 3,44 %. Kondisi ini diyakini oleh adanya perbedaan resistensi lapisan magnetik dengan lapisan konduktif pada sistem multilapisan. Nilai resistensi sampel yang terukur berbanding terbalik terhadap fungsi x sebagai ketebalan lapisan konduktif. Artinya berkurangnya lapisan konduktif dapat meningkatkan sifat magnetik sampel untuk sistem multilapisan [Nife/Cu]N. Analisa perhitungan nilai sensitifitas juga menunjukan potensi kenaikan sensitifitas sampel tertinggi sampai 0,9746 %/mT.
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