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Contact Name
Irfan Nurdiansyah
Contact Email
irfannurdiansyah2711@gmail.com
Phone
+6282115216307
Journal Mail Official
irfannurdiansyah2711@gmail.com
Editorial Address
Jl Wagino Sidamulya, RT 03/09, Langensari, Langensari Banjar, West Java
Location
Kota banjar,
Jawa barat
INDONESIA
Techne: Journal of Engineering, Technology and Industrial Applications
Published by Kalam Practica Media
ISSN : -     EISSN : 31246559     DOI : -
Techne: Journal of Engineering, Technology and Industrial Applications is a peer-reviewed open-access journal dedicated to advancing scholarly work in engineering, applied technology, and industrial innovation. Techne publishes high-quality empirical research, technical reports, experimental studies, design analyses, case studies, and emerging technology reviews that contribute to the development and application of engineering solutions. The journal aims to bridge academic research and real-world technological practices by providing a platform for researchers, engineers, practitioners, and industry experts to disseminate new insights. Techne encourages submissions that demonstrate originality, methodological rigor, and practical value in supporting technological growth and industrial problem-solving. All submitted manuscripts undergo an objective and constructive review process conducted by experts in relevant fields. Techne is published by the Kalam Practica Research Group and operates under an open-access policy to ensure global accessibility of scientific knowledge. Scopes include (but are not limited to): Mechanical, electrical, and civil engineering Industrial systems and manufacturing technology Information technology and applied computing Automation, robotics, and control systems Energy systems and sustainable engineering Material science and industrial design Geospatial engineering and technical instrumentation Innovation, prototyping, and applied industrial research Techne welcomes interdisciplinary works and studies that integrate engineering with technology-driven industrial applications.
Articles 42 Documents
Healthcare Emergency Triage: Quantifying Safety, Throughput, and Equity Risk Under Uncertainty, Crowding, and Decision Latency Sreyneang Keo Sreyneang Keo
Techne: Journal of Engineering, Technology and Industrial Applications Vol. 1 No. 4 (2025): Techne: Journal of Engineering, Technology and Industrial Applications
Publisher : Kalam Practica Media

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Abstract

This article proposes an engineering-oriented reliability framework for emergency triage that models end-to-end uncertainty propagation from initial symptoms and vital signs through decision rules, reassessment intervals, queueing dynamics, and escalation policies into distributional outcomes that matter for safety and service performance, including probability of under-triage, time-to-provider exceedance probability, adverse clinical event risk before definitive evaluation, over-triage burden, and an operational cost and harm index that integrates patient risk with resource strain. A scenario-based quantitative study is developed for a generic high-volume emergency department serving mixed-acuity adult patients, comparing four triage architectures: baseline scale-based triage with static rules and discretionary reassessment, expanded screening with more data but without governance, calibrated risk scoring with static thresholds, and a governance-optimized two-tier system that combines calibrated risk scoring, explicit uncertainty handling, capacity-aware dynamic thresholds, staged reassessment with trigger-based escalation, and safety-bounded operational controls. Results show that adding data or algorithms without governance can increase volatility and over-triage under crowding, that calibrated scoring improves stability but is fragile when queueing regimes shift, and that the two-tier governed architecture reduces under-triage and time-to-provider exceedances while stabilizing resource use and reducing inequitable failure patterns under documentation noise and surge conditions. Three copy-ready tables and complete prompts for data-driven figures are provided for Techne submission.
Semiconductor Wafer Fab Yield: Quantifying Defect Escape, Metrology Uncertainty, and Time-to-Containment Under Process Drift and Inspection Capacity Constraints Lê Thị Hồng Nhung Lê Thị Hồng Nhung
Techne: Journal of Engineering, Technology and Industrial Applications Vol. 1 No. 4 (2025): Techne: Journal of Engineering, Technology and Industrial Applications
Publisher : Kalam Practica Media

Show Abstract | Download Original | Original Source | Check in Google Scholar

Abstract

This article presents an engineering-oriented reliability framework for wafer fab yield management that models end-to-end uncertainty propagation from process drift and measurement uncertainty through sampling-based inspection, excursion detection, and containment decisions into distributional outcomes relevant to manufacturing performance, including probability of defect escape, expected affected wafers before containment, false containment probability, time-to-detection and time-to-containment distributions, and an economic yield-loss index. A scenario-based quantitative study is developed for a generic high-volume fab with multiple critical tools and a mix of in-line metrology and inspection, comparing four architectures: baseline control charts with fixed sampling, expanded inspection without governance, model-based excursion detection with limited capacity awareness, and a governance-optimized two-tier architecture that combines drift-aware metrology validation, dynamic sampling allocation based on risk and tool health, staged containment policies, and capacity-aware triage for engineering review. Results show that increasing inspection without governance can reduce defect escape but can increase false containment and cycle-time penalties, that model-based detection improves time-to-detection but can fail under miscalibration and review overload, and that a two-tier governed approach reduces expected yield loss by reducing tail propagation and stabilizing containment decisions under drift and capacity constraints. Three copy-ready tables and complete prompts for data-driven figures are provided for Techne submission.