Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (510.712 KB) | DOI: 10.32668/jitek.v4i2.69
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24843/MIFI.2022.v10.i03.p08
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2023.240
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2024.296
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2024.366
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2024.378
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jpmfki.2025.445
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2025.391
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59946/jfki.2025.393