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Atmega328P-based X-ray Machine Exposure Time Measurement Device with an Android Interface Widadi, Sigit; Khairul Huda, Muhammad; Ahmad, Irfan; tanane, Omar
Journal of Robotics and Control (JRC) Vol 1, No 3 (2020): May
Publisher : Universitas Muhammadiyah Yogyakarta

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.18196/jrc.1318

Abstract

The purpose of this study was to design an X-ray microcontroller-based ATmega328P microcontroller exposure time measurement device. That can be done by integrating an X-ray detection circuit, analog signal conditioner, ATmega328P microcontroller and Bluetooth module HC-05 to display and control the measurement results on mobile phones Android. The benefits of this research are expected to be able to increase knowledge and expertise in the field of radiology instruments through X-ray machine parameter measurement techniques and assist technicians to calibrate the X-ray exposure time parameters.