Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31001/tekinfo.v6i1.298
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.23917/jiti.v5i1.1592
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (314.312 KB) | DOI: 10.37631/jri.v1i1.57
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (625.189 KB) | DOI: 10.37631/jri.v2i1.128
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (502.248 KB) | DOI: 10.37631/jri.v1i1.58
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37631/jri.v2i2.181
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37631/jri.v3i2.484
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25157/j-kip.v6i2.18872