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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35580/inovasi.v4i1.66418
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v4i1.66417
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51574/jip.v4i2.324
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v4i1.66416
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.29303/jppipa.v11i3.10874
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.65943/ck8n1254
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35580/smart.v6i1.78416
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35580/smart.v6i1.78412
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35580/smart.v6i1.78410