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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v1i01.51
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v2i01.57
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v2i02.96
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v3i01.120
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v4i02.156
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v5i02.255
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v5i02.259
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v20i01.175
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.71466/jiktif.v2i1.71
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.71466/jiktif.v2i1.71