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Journal : Bulletin of Electrical Engineering and Informatics

Secure lightweight obfuscated delay-based physical unclonable function design on FPGA Mohammad Haziq Ishak; Mohd Syafiq Mispan; Wong Yan Chiew; Muhammad Raihaan Kamaruddin; Mikhail Aleksandrovich Korobkov
Bulletin of Electrical Engineering and Informatics Vol 11, No 2: April 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v11i2.3265

Abstract

The internet of things (IoT) describes the network of physical objects equipped with sensors and other technologies to exchange data with other devices over the Internet. Due to its inherent flexibility, field-programmable gate array (FPGA) has become a viable platform for IoT development. However, various security threats such as FPGA bitstream cloning and intellectual property (IP) piracy have become a major concern for this device. Physical unclonable function (PUF) is a promising hardware fingerprinting technology to solve the above problems. Several PUFs have been proposed, including the implementation of reconfigurable-XOR PUF (R-XOR PUF) and multi-PUF (MPUF) on the FPGA. However, these proposed PUFs have drawbacks, such as high delay imbalances caused by routing constraints. Therefore, in this study, we explore relative placement method to implement the symmetric routing in the obfuscated delay-based PUF on the FPGA board. The delay analysis result proves that our method to implement the symmetric routing was successful. Therefore, our work has achieved good PUF quality with uniqueness of 48.75%, reliability of 99.99%, and uniformity of 52.5%. Moreover, by using the obfuscation method, which is an Arbiter-PUF combined with a random challenge permutation technique, we reduced the vulnerability of Arbiter-PUF against machine learning attacks to 44.50%.
A review paper on memory fault models and test algorithms Aiman Zakwan Jidin; Razaidi Hussin; Lee Weng Fook; Mohd Syafiq Mispan
Bulletin of Electrical Engineering and Informatics Vol 10, No 6: December 2021
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v10i6.3048

Abstract

Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requirement. Several memory testing algorithms that are used in memory built-in self-test (BIST) are discussed, in terms of test operation sequences, fault detection ability, and also test complexity. From the studies, it shows that tests with 22 N of complexity such as March SS and March AB are needed to detect all static unlinked or simple faults within the memory cells. The N in the algorithm complexity refers to Nx*Ny*Nz whereby Nx represents the number of rows, Ny represents the number of columns and Nz represents the number of banks. This paper also looks into optimization and further improvement that can be achieved on existing March test algorithms to increase the fault coverage or to reduce the test complexity.