Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/jurnal_tekkim.v9i1.722
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/jurnal_tekkim.v11i1.826
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/jurnal_tekkim.v12i1.842
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/jurnal_tekkim.v13i1.1149
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2020.v4i2.858
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2020.v4i2.858
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11594/nstp.2021.0906
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (2650.665 KB) | DOI: 10.30738/ad.v2i2.3524
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36339/je.v6i3.688