Article Per Year (5 Year)
p-Index From 2020 - 2025
1.431
P-Index
This Author published in this journals
All Journal Jurnal Penelitian Pendidikan Al-Kharaj: Jurnal Ekonomi, Keuangan & Bisnis Syariah JKP | JURNAL KEPEMIMPINAN PENDIDIKAN Jurnal Ilmiah Manajemen dan Ilmu Sosial : Co-Management Abdimas Polsaka: Jurnal Pengabdian Masyarakat Makara Journal of Science Journal of Accounting, Management, Economics, and Business Journal of Business Education and Social Jurnal Abdimas
Suminar, Suminar
Unknown Affiliation
Decision Sciences, Operations Research & Management Economics, Econometrics & Finance Education Health Professions Languange, Linguistic, Communication & Media Mathematics Nursing Public Health Social Sciences Other

Published : 11 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 3 Documents
Search
Journal : Makara Journal of Science

 1 
PENGARUH JANGKAU SUDUT UKUR PADA HASIL ANALISIS DATA DIFRAKSI SINAR-X MENGGUNAKAN METODE RIETVELD: KASUS CAMPURAN MgO-Y2O3 Suminar, Suminar
Makara Journal of Science Vol. 12, No. 2
Publisher : UI Scholars Hub

Show Abstract | Download Original | Original Source | Check in Google Scholar

Abstract

Selection of Diffraction Measurement Range and Its Effect on X-ray Diffraction Rietveld Analysis Results: a MgO-Y2O3 Mixture Case. X-ray diffraction data analyses for a MgO-Y2O3 (30% Y2O3 by weight) ceramic composite have been done at various diffraction angle ranges to evaluate the effects to the analyses results. The study was performed as choosing the angle ranges correlates to data collection time and x-ray tube lasting. The analyses utilised Rietveld-based software Rietica. The ranges chosen were (A) 10-100, (B) 10-90, (C) 10-80, (D) 10-70 dan (E) 10-60 °2θ. Results showed that in general the errors of the refined parameters increased with narrower range. Phase composition analyses also showed significant bias when narrower range was used – with range 10-80 °2θ gave tolerable result. Moreover, narrowing diffraction angle in the analysis significantly biases the Lorentzian peak broadening component values particularly for phase with crystallite size estimate more than 100 nm. The study recommends how to choose the range.
PENGARUH JANGKAU SUDUT UKUR PADA HASIL ANALISIS DATA DIFRAKSI SINAR-X MENGGUNAKAN METODE RIETVELD: KASUS CAMPURAN MgO-Y2O3 Suminar, Suminar
Makara Journal of Science Vol. 11, No. 2
Publisher : UI Scholars Hub

Show Abstract | Download Original | Original Source | Check in Google Scholar

Abstract

Selection of Diffraction Measurement Range and Its Effect on X-ray Diffraction Rietveld Analysis Results: a MgO-Y2O3 Mixture Case. X-ray diffraction data analyses for a MgO-Y2O3 (30% Y2O3 by weight) ceramic composite have been done at various diffraction angle ranges to evaluate the effects to the analyses results. The study was performed as choosing the angle ranges correlates to data collection time and x-ray tube lasting. The analyses utilised Rietveld-based software Rietica. The ranges chosen were (A) 10-100, (B) 10-90, (C) 10-80, (D) 10-70 dan (E) 10-60 °2θ. Results showed that in general the errors of the refined parameters increased with narrower range. Phase composition analyses also showed significant bias when narrower range was used – with range 10-80 °2θ gave tolerable result. Moreover, narrowing diffraction angle in the analysis significantly biases the Lorentzian peak broadening component values particularly for phase with crystallite size estimate more than 100 nm. The study recommends how to choose the range.
PENGARUH JANGKAU SUDUT UKUR PADA HASIL ANALISIS DATA DIFRAKSI SINAR-X MENGGUNAKAN METODE RIETVELD: KASUS CAMPURAN MgO-Y2O3 Suminar, Suminar
Makara Journal of Science Vol. 12, No. 2
Publisher : UI Scholars Hub

Show Abstract | Download Original | Original Source | Check in Google Scholar

Abstract

Selection of Diffraction Measurement Range and Its Effect on X-ray Diffraction Rietveld Analysis Results: a MgO-Y2O3 Mixture Case. X-ray diffraction data analyses for a MgO-Y2O3 (30% Y2O3 by weight) ceramic composite have been done at various diffraction angle ranges to evaluate the effects to the analyses results. The study was performed as choosing the angle ranges correlates to data collection time and x-ray tube lasting. The analyses utilised Rietveld-based software Rietica. The ranges chosen were (A) 10-100, (B) 10-90, (C) 10-80, (D) 10-70 dan (E) 10-60 °2θ. Results showed that in general the errors of the refined parameters increased with narrower range. Phase composition analyses also showed significant bias when narrower range was used – with range 10-80 °2θ gave tolerable result. Moreover, narrowing diffraction angle in the analysis significantly biases the Lorentzian peak broadening component values particularly for phase with crystallite size estimate more than 100 nm. The study recommends how to choose the range.
Co-Authors Aftina Nurul Husna Anna Umilla, Rizqa Apriliani, Irrena Chaerunisa, Siti Cornelia Rahandity, Dionisia DINI NURDIANI Febriyanti Hartini, Eka Handayani, Idah Hernawati, Erni Hijriah Handayani, Elis Indriyani, Silvia Ipang Setiawan Komalasari , Neng Sinta Komalasari , Nita Lulu April Farida Maelani, Leni Marlina Marlina Prihatin Ningrum, Yuan Ratna Sari Priatna, Fuji Roas Irsyada, Roas Sahab, Dhoni Frizky Arya Santi Wijayanti, Dwi Gansar Siti Masriyah Tadita, Armayta Dwi Veranita, Mira Wahyudi, Anang Eko Widiarti, Aniek Willy Sri Yuliandhari Yoris Adi Maretta YUSUF, RAMAYANI