Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2024.v28i2.5982
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jasmet.2024.v5i2.6089
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15408/jipl.v4i2.42497
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jemt.2022.v2i2.2882
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.29244/jsil.10.2.375-384
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15408/jipl.v4i2.42497
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25299/jgeet.2025.10.3.19690