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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v3i2.4546
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v5i1.76584
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35965/ursj.v6i1.3863
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v1i3.3021
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3282
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3284
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v3i3.3203