Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jcepd.2023.v2i2.5004
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jcepd.2023.v2i1.4177
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2025.v29i1.6660
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37477/lkr.v1i2.260
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.tekstur.2024.v5i1.5795
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.tekstur.2023.v4i2.4957
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jcepd.2025.v4i2.7693
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jcepd.2025.v4i2.8228
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56444/sarga.v20i1.3125