Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (542.852 KB) | DOI: 10.54732/jeecs.v1i1.184
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54732/jeecs.v8i1.5
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54732/i.v2i1.1141
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22441/jitkom.v7i2.007
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69688/dike.v2i1.66
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69688/dike.v3i1.121
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69688/dike.v3i1.122
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69688/dike.v3i1.124
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2023.v27i1.3697
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.46984/sebatik.v29i2.2721