Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2024.v28i1.5499
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22441/pasti.2024.v18i3.008
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52759/inventory.v5i2.204
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52759/sainti.v20i1.204
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2023.v27i1.2344
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.28989/jumantara.v4i2.2986
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52759/inventory.v5i2.204
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52759/jice.v1i2.147
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25170/metris.v24i02.4380
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2025.v29i2.7557