Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2017.v21i2.91
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.14710/jil.19.3.582-587
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (3556.827 KB) | DOI: 10.32509/am.v3i01.976
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (218.369 KB) | DOI: 10.31848/ejtl.v1i2.144
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (116.592 KB) | DOI: 10.20527/jukung.v3i2.4026
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jasmet.2020.v1i1.871