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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.0301/jttb.v2i1.59
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.0301/jttb.v2i1.61
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.0301/jttb.v2i1.63
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20956/pa.v6i4.18122
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24003/emitter.v10i2.702
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (609.854 KB) | DOI: 10.0301/jttb.v2i1.59
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (464.96 KB) | DOI: 10.0301/jttb.v2i1.61
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (407.112 KB) | DOI: 10.0301/jttb.v2i1.63
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24003/emitter.v11i2.832
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/resistor.7.1.27-32