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All Journal Jurnal Paradigma Ekonomika TEKMAPRO Journal of Industrial Engineering and Management SITEKIN: Jurnal Sains, Teknologi dan Industri Sistemasi: Jurnal Sistem Informasi Policy & Governance Review Educatio INTECOMS: Journal of Information Technology and Computer Science Journal of Entrepreneurship, Management and Industry (JEMI) JURNAL TEKNOLOGI DAN OPEN SOURCE Almana : Jurnal Manajemen dan Bisnis JUSIM (Jurnal Sistem Informasi Musirawas) JURNAL TEKNOLOGI INFORMASI Jurnal Ilmiah Akuntansi Manajemen Jurnal Teknologi Informasi dan Multimedia Journal of Information Systems and Informatics Jurnal Ilmiah Betrik : Besemah Teknologi Informasi dan Komputer International Journal of Economics Development Research (IJEDR) Prosiding National Conference for Community Service Project Jurnal Industri Kreatif dan Kewirausahaan Jurnal E-Komtek JOURNAL OF INFORMATION SYSTEM RESEARCH (JOSH) Jurnal Manajemen Bisnis Eka Prasetya Economics and Digital Business Review Teknika Jurnal Akuntansi, Manajemen dan Ilmu Ekonomi (JASMIEN) Journal La Bisecoman International Journal of Global Accounting, Management, Education, and Entrepreneurship (IJGAME2) JEBDEKER: Jurnal Ekonomi, Manajemen, Akuntansi, Bisnis Digital, Ekonomi Kreatif, Entrepreneur Journal of Information System and Technology (JOINT) Jurnal Info Sains : Informatika dan Sains Conference on Management, Business, Innovation, Education and Social Sciences (CoMBInES) Conference on Business, Social Sciences and Technology (CoNeScINTech) Social Engagement: Jurnal Pengabdian Kepada Masyarakat Madani: Jurnal Pengabdian Masyarakat dan Kewirausahaan Jurnal Ilmiah Betrik : Besemah Teknologi Informasi dan Komputer
Aripradono, Heru Wijayanto
Universitas Internasional Batam
Aerospace Engineering Arts Humanities Civil Engineering, Building, Construction & Architecture Computer Science & IT Control & Systems Engineering Decision Sciences, Operations Research & Management Economics, Econometrics & Finance Education Electrical & Electronics Engineering Engineering Environmental Science Industrial & Manufacturing Engineering Social Sciences Other

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Journal : JOURNAL OF INFORMATION SYSTEM RESEARCH (JOSH)

 1 
Integrasi Feature Engineering dan SMOTE pada Algoritma Random Forest untuk Prediksi Kerusakan Chip RFID di Industri Sel Surya Haeruddin, Haeruddin; Winata, Franklin; Tresnawan, Muhammad Ilham Ashiddiq; Wijaya, Gautama; Wijayanto Aripradono, Heru
Journal of Information System Research (JOSH) Vol 7 No 2 (2026): January 2026
Publisher : Forum Kerjasama Pendidikan Tinggi (FKPT)

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47065/josh.v7i2.9038

Abstract

The electronics industry, particularly solar cell manufacturing, demands production processes that are fast, precise, and supported by high data integrity. One critical component in the production flow is the chip embedded in the flower basket, which functions to store and transmit data through an RFID system. Damage to the chip can lead to information loss, tag reading failures, and disruptions in production efficiency and continuity. This study aims to predict chip status, classified as either normal or damaged, based on various process parameters, including immersion temperature, ambient humidity, process pressure, machine vibration, drying speed, heating and cooling duration, firing temperature, usage frequency, and RFID reading conditions. A feature engineering approach is applied to construct more representative derived features, while SMOTE is utilized to address class imbalance in the dataset. This study focuses on developing a predictive model using the Random Forest method to identify the most influential process variables related to chip damage risk. The data used in this study are obtained from historical production process records of a solar cell manufacturing plant. The results indicate that combinations of multiple process parameters significantly contribute to the potential risk of chip damage, and the Random Forest model demonstrates good predictive performance in classifying chip conditions. These findings suggest that the proposed model can serve as an early warning system to detect chip damage risks before they impact production processes. With proper implementation, the predictive model is expected to support preventive actions, enhance data integrity, and minimize disruptions in the solar cell manufacturing workflow.
Co-Authors Abdul Wahab Alzi Alzi Andik Yulianto Ariadi, Cindy Arron Arron Avista Mindy Benhans, Devina Boby Candra Candra, Boby Christina Christina Christy Christy David David David Febrian Defryn Fratelry Willim Elisna Levia Elisna Levia Elvin, Elvin Erick Erick Ervin Setyawan Al Wen Jun Evander, Owen Febrianto Febrianto, Febrianto Felix Felix Felix Jethro Holly Galang, Yehezkiel Putra Gautama Wijaya Gracia, Nicole Haeruddin Haeruddin Haeruddin Haeruddin, . Hengki Hengki Hirawan, Jason Idayanti Nursyamsi Ikhlas, Junior Jemmy Jemmy Jerry Jardian Jery Tango Jong, Ricky Jucelyn, Devica Kelvianto Kelvin Kelvin Kevin Anderson Kevin Anderson Kisusyenni Kisusyenni Venessa Kisusyenni Venessa Kurnia Cantra Kurniawan, Jasen Lau, Vionny Leonardo, Kevin Lim, Daniel Melvin, Melvin Mettatama Gandha Puspita Michael Owen Mieko Huang Vincent Muhammad Ardiansyah Muhammad Ardiansyah Muhammad Dzaky Akbar Muhammad Rivaldy Hisham Natalia , Sherly Celia Ningsih, Vivian Febri Nursudiono Nursudiono Nursudiono, Nursudiono Peiwen , Sally Tan Prasetyo, Stefanus Eko Putra, Rezki Sari Raudlatul Khairiah Ricardo Ricardo Ricardo Rio Putra, Rio Ruben Pangeran Pangestu Silvina Silvina Silvina, Silvina Sofyanti, Sofyanti SULTAN, ZULKIFLI Te, Celine Tiffany, Evellyn Try Tina Tina Tjahyadi, Surya Tresnawan, Muhammad Ilham Ashiddiq Vanessa Felicia Leedora Vincent Vanessa Ting Vincent Vincent Vivian Vivian Vivian Vivian Viviany Viviany Wandi Wandi William Wilsen Lau Winata, Franklin Winson Kennedy Winson Ng Yap Rui Qi, Katherine Oktaviani