Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (722.166 KB) | DOI: 10.30870/volt.v1i1.806
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (483.382 KB) | DOI: 10.24114/jtikp.v9i1.35478
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (297.392 KB) | DOI: 10.24114/jtikp.v8i2.31386
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52436/1.jpmi.758
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33019/electron.v4i2.57
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24114/jtikp.v10i2.54010
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24114/jtikp.v10i2.54006
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24114/jtikp.v11i1.60288
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24114/jtikp.v11i1.60285
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24114/jtikp.v10i2.54009