Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/jiptek.v12i2.24288
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/jiptek.v12i1.19118
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/jiptek.v11i1.17990
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (193.613 KB) | DOI: 10.20961/ijie.v3i1.32116
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v4i1.44580
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v1i2.11432
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v4i1.44727
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v1i1.8298
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/joive.v5i1.62570
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/dedikasi.v4i2.56299