Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (885.418 KB) | DOI: 10.24071/mt.v11i1.512
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32734/jsti.v23i1.4368
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24071/mt.v11i1.512
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/peka.v6i2.4892
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52166/dearsip.v4i02.7800
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2022.v6i2.2148
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/wt.v16i1.964
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/wt.v7i1.1265
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/wt.v7i2.1273