Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (894.315 KB) | DOI: 10.24071/mt.v11i2.517
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.13170/aijst.12.3.30259
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/peka.v6i2.4960
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33508/peka.v6i1.4929
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35814/suluh.v4i1.2984
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35814/suluh.v4i2.4244
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2024.v8i1.2748
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36407/berdaya.v5i3.1115
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36841/mimbarintegritas.v4i1.5532