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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v3i02.148
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56923/jtek.v3i02.150
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58812/wsjee.v1i07.459
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v15i01.1
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v17i02.22
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v17i02.23
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v15i02.30
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v16i01.42
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v16i01.43
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v16i02.45