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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3283
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3288
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3292
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v2i1.3303
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jebe.v3i2.8104
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v5i2.82648
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v4i1.4361
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56326/jptsk.v4i1.4996