Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (456.429 KB) | DOI: 10.31284/j.jpp-iptek.2018.v2i2.305
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (616.874 KB) | DOI: 10.31284/j.jpp-iptek.2018.v2i1.194
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (455.953 KB) | DOI: 10.32528/justindo.v2i2.1050
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/scan.v11i3.867
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33005/jifti.v1i2.20
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30996/jpm17.v3i2.1575
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2018.v2i1.194
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2018.v2i2.305
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37729/intek.v5i1.1691
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (594.458 KB) | DOI: 10.30742/melekitjournal.v1i2.49