Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1993.025 KB) | DOI: 10.12962/j26139960.v6i4.289
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1560.684 KB)
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j26139960.v7i4.540
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j26139960.v8i2.993
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31479/jtek.v11i1.278
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31479/jtek.v11i1.280
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31479/jtek.v11i1.281
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2022.v6i2.2346
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar