Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58169/jpmsaintek.v2i3.194
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58169/jpmsaintek.v2i3.196
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.17977/um045v6i3p149-155
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26905/jmdk.v12i2.13922
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.63922/ijevss.v3i02.861
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.62951/unggulan.v1i3.289
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58794/jdt.v5i2.1501
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31949/jb.v6i3.14412