Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (605.659 KB) | DOI: 10.32528/pengabdian_iptek.v4i2.1845
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (606.636 KB) | DOI: 10.32528/pengabdian_iptek.v2i1.375
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/bb.v5i2.2789
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31764/jces.v6i2.10058
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47134/jpn.v1i3.294
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/pl.6.1.11-20
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26737/jp-bsi.v9i1.5396
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25273/widyabastra.v12i2.21610
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/pl.7.2.120-127
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36312/jolls.v4i4.2362