Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (310.608 KB) | DOI: 10.32528/pengabdian_iptek.v2i1.376
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25273/widyabastra.v12i1.20397
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25273/widyabastra.v12i1.20394
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37985/jer.v4i4.427
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v7i3.11421
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30998/jh.v8i1.2732
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.29040/budimas.v6i3.12872
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25273/widyabastra.v12i2.21540
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25273/widyabastra.v12i2.21610
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36312/jolls.v4i4.2360