Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/kreasi.v5i1.1220
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/kreasi.v5i1.1228
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2023.v7i2.5038
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1012.798 KB) | DOI: 10.37715/aksen.v3i1.663
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (800 KB) | DOI: 10.37715/aksen.v3i2.802
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/aksen.v4i2.1315
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/aksen.v5i1.1583
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/aksen.v6i1.2330
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/aksen.v8i3.4623
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/kreasi.v9i1.4275