Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1119.879 KB) | DOI: 10.21063/jtif.2013.V1.2.13-19
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (796.512 KB) | DOI: 10.21063/jtif.2021.V9.2.82-91
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36448/expert.v12i1.2553
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (732.91 KB) | DOI: 10.35134/komtekinfo.v6i2.51
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33395/jmp.v12i1.12418
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (435.257 KB) | DOI: 10.33372/stn.v8i2.901
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33395/jmp.v12i2.13019
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36448/jsit.v14i2.3283
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32699/device.v13i2.5526
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32764/saintekbu.v17i01.5007