Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.57203/session.v2i02.2024.61-68
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36526/ztr.v7i2.6204
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36526/ztr.v7i2.6450
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (433.328 KB) | DOI: 10.29407/intensif.v3i1.12508
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (843.916 KB) | DOI: 10.29407/intensif.v5i2.15287
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.29407/intensif.v7i2.20093
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2025.v9i2.8316