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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/ijses.v5i2.68621
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/ijses.v6i1.74119
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/karya.v4i1.73606
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v4i3.72239
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51574/jrip.v5i2.3586
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59066/jmae.v4i2.1586
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58266/jpmb.v4i2.666
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58266/jpmb.v4i2.826