Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2025.v9i2.8281
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33751/jpsik.v7i2.8596
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31538/iijse.v9i1.9639
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35870/jtik.v9i4.4024
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11594/ijssr.06.01.04
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11594/ijssr.06.01.11
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.38142/ijesss.v5i4.978
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.38142/ijesss.v5i4.1027
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.38142/ijesss.v6i1.1344
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.38142/ijesss.v6i2.1371