Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (663.955 KB)
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (371.841 KB) | DOI: 10.22219/JTIUMM.Vol19.No1.21-27
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (732.008 KB) | DOI: 10.22219/JTIUMM.Vol19.No2.157-165
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2020.v4i1.558
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22219/JTIUMM.Vol19.No1.21-27
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22219/JTIUMM.Vol19.No2.157-165
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/jisi.9.1.59-69
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25124/ijies.v2i01.13
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2020.v4i1.558
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.0301/jttb.v2i2.50